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Weeroc products

Weeroc is a spin-off company from Omega laboratory (IN2P3/CNRS French governmental agency for fundamental research in astrophysics, particle physics and nuclear physics) and today offers a full range of products to read out the most widely used detectors in science and industry. In particular, it provides off-the-shelf programmable analog and mixed front-end ASICs for photon and particle detectors readout, together with Testboards specifically designed for each ASIC.

Weeroc products

WHAT WE DO

Weeroc designs and provides front-end ASICs for science and industry, suitable for the readout of commonly used particle detectors.

The simplest way to test and characterize a Weeroc ASIC, with no need to build a custom electronics.

128-channels platform with multiple Weeroc ASICs for evaluation of experimental setups. The programmable FPGA makes it ideal for protoyping and lab development.


NOW AVAILABLE with CITIROC or PETIROC for SiPM readout in imaging, spectroscopy, PET and ToF applications

CAEN solution based on Weeroc CITIROC ASIC for the readout of 32-channels SiPM arrays

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ASICs

Testboard

DT5550W

A1702/DT5702

Weeroc is a spin-off company from Omega laboratory (IN2P3/CNRS French governmental agency for fundamental research in astrophysics, particle physics and nuclear physics) and today offers a full range of products to read out almost any kind of detector. In particular, it provides off-the-shelf programmable analog and mixed front-end ASICs for photon and particle detectors readout, together with Testboards specifically designed for each ASIC.

WEEROC CATALOG

WEEROC WEBSITE

and more sinergies...

64-channels board for SiPM readout based on two CITIROC ASICs. Compatible with FERS-5200, a CAEN modular and easy-scalable platform for the readout of large arrays of detectors.

A5202/DT5202

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ASICs Chip

Weeroc designs and produces front-end ASICs for the readout of most commonly used particle detectors, suitable for a wide range...

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Testboard

Weeroc Testboards are compact platforms designed to test and evaluate the performance of a single ASIC.

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