Silicon Photomultiplier (SiPM) Advanced Statistics
High level experiments based on SiPM technology related to statistical properties of the light and algorithms for background subtraction
A series of experiments covering several applications has been carried out and are presented in this section through detailed Educational Notes. The collaboration with the University of Insubria allows to offer experiments based on Silicon Photo-Multiplier detectors for advanced laboratories using the latest instrumentation generation developed by CAEN for the major experiments Worldwide.
For every topic, an accompanying suite is being developed, including an instructor’ guide, indications on the analysis and a library of routines in MATLAB, a platform widely distributed in the academic community.
Overview
Equipment | ||||||||
---|---|---|---|---|---|---|---|---|
Experiment | SP5600C | SP5600D | SP5600E | SP5600AN | SP5600EMU | SP5701 | SP5620CH | SP5630EN |
ED3127 - An Educational Kit Based on a Modular SiPM System | ✅ | ✅ | ||||||
ED3163 - A simple and robust method to study after-pulses in Silicon Photomultipliers | ✅❌ | ✅❌ | ||||||
ED3235 - Background removal procedure based on the SNIP algorithm for γ−ray spectroscopy | ✅ | ✅ |
❌ – the experiment can be performed only by adding an extra device, the DT993 – Desktop Dual Timer
SP5600AN Kit suggested for these experiments.
Experiments
- ED3127 – An Educational Kit Based on a Modular Silicon Photomultiplier System
An educational experiment based on a SiMP set-up is proposed in this Educational Note, guiding the student towards a comprehensive knowledge of this sensor technology while experiencing the quantum nature of light and exploring the statistical properties of the light pulses emitted by a LED. - ED3163 – Background removal procedure based on the SNIP algorithm for Gamma-ray Spectroscopy with the CAEN Educational Kit
A widely used method for subtracting the background under a photo-peak is provided by the Sensitive Nonlinear Iterative Peak (SNIP) algorithm. This Note reports a validation procedure of the SNIP algorithm, based on the invariance of the photo-peak area for different background levels. - ED3235 – A simple and robust method to study after-pulses in Silicon Photomultipliers
This note describes a method for the characterization of the after-pulses in Silicon Photomultipliers. The after-pulsing probability in SiMP and its time constant are obtained measuring the mean number of photo-electrons in a variable time window following a light pulse. The method, experimentally simple and statistically robust due to the use of the Central Limit Theorem, has been applied to an HAMAMATSU MPPC S10362-11-100C.
Equipment
SP5600E – Educational Photon Kit
SP5600 | DT5720A | SP601 | SP5650C |
Power Supply & Amplification Unit | Desktop Digitizer 250 MS/s | LED Driver | Sensor Holder for SP5600 with SiMP |
SP5600C – Educational Gamma Kit
SP5600 | DT5720A | A315 | SP5606 | SP5607 |
Power Supply & Amplification Unit | Desktop Digitizer 250 MS/s | Splitter | Mini Spectrometer | Absorption Tool |
Educational Kit
Equipment | ||||||||
---|---|---|---|---|---|---|---|---|
Experiment | SP5600C | SP5600D | SP5600E | SP5600AN | SP5600EMU | SP5701 | SP5620CH | SP5630EN |
ED3127 - An Educational Kit Based on a Modular SiPM System | ✅ | ✅ | ||||||
ED3163 - A simple and robust method to study after-pulses in Silicon Photomultipliers | ✅❌ | ✅❌ | ||||||
ED3235 - Background removal procedure based on the SNIP algorithm for γ−ray spectroscopy | ✅ | ✅ |
❌ – the experiment can be performed only by adding an extra device, the DT993 – Desktop Dual Timer
SP5600AN Kit suggested for these experiments.
Interfaces & I/O
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Software
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Request info
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Brochure
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